{"Available modes":{"11":"SALI","12":"SALI Grupper","13":"TX-Scan","14":"Concurrent PE/TX","15":"D-Scan","16":"3D","1":"A-Scan","2":"Patch Scan","3":"Top Scan","4":"Falskner Detektion","5":"B-Scan","6":"Focus B","7":"Sub B","8":"Cross B","9":"C-Scan","10":"Dual Gate"},"Applications":{"1":"Real-time A-scan & A-scan Capture","2":"B-scan & SLICE","3":"Threshold Mapping (post-processing)","4":"Frequency Domain Imaging (FFT)","5":"C-scan med Multi-gate SALI & SALI Grupper","6":"Cluster Analyse (post processing)","7":"Avancerede Time-of-Flight & Tykkelsesmålinger","8":"Scan Matematik Før og Efter Reflow Karakterisering","9":"3D Imaging","10":"Void Gating (real-time)"},"XYZ resolution":"1 μm","Scanning speed":"fra 20 mm/s ved 50 MHz frekvens","Working area":"400x400x200 mm","Travel Speed":"500 mm/s"}